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Laser Xe+ Plasma FIB-SEM: Correlative microscopy of 3D microstructures from nanometers to millimeters - 2020 - Wiley Analytical Science
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The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber | Applied Microscopy | Full Text
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Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system - ScienceDirect
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The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber | Applied Microscopy | Full Text
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The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber | Applied Microscopy | Full Text
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Laser FIB Platform - Ultra Precision from The EPSRC Centre for Innovative Manufacturing in Ultra Precision
![Laser and focused ion beam combined machining for micro dies: Review of Scientific Instruments: Vol 83, No 2 Laser and focused ion beam combined machining for micro dies: Review of Scientific Instruments: Vol 83, No 2](https://aip.scitation.org/action/showOpenGraphArticleImage?doi=10.1063/1.3662018&id=images/medium/1.3662018.figures.f1.gif)
Laser and focused ion beam combined machining for micro dies: Review of Scientific Instruments: Vol 83, No 2
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The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber | Applied Microscopy | Full Text
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Metals | Free Full-Text | FIB-SEM Investigation of Laser-Induced Periodic Surface Structures and Conical Surface Microstructures on D16T (AA2024-T4) Alloy
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Metals | Free Full-Text | FIB-SEM Investigation of Laser-Induced Periodic Surface Structures and Conical Surface Microstructures on D16T (AA2024-T4) Alloy
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The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber | Applied Microscopy | Full Text
![Fig. 3.10, SEM micrograph of an FIB cross-section showing the top section of a hole structure ablated by temporally shaped (TOD) fs-laser pulses in SiO2 (a). Top view of a photonic crystal Fig. 3.10, SEM micrograph of an FIB cross-section showing the top section of a hole structure ablated by temporally shaped (TOD) fs-laser pulses in SiO2 (a). Top view of a photonic crystal](https://www.ncbi.nlm.nih.gov/books/NBK321730/bin/oin_p1_ch3.f10.jpg)